Rigaku manufactures a variety of analytical instruments that use X-rays to determine the composition and structure of materials. Our technologies include general and single crystal X-ray diffraction, wavelength dispersive and energy dispersive X-ray fluorescence, transmission X-ray fluorescence, X-ray reflectometry, small- and wide-angle X-ray scattering and much more.
One application where many of these technologies intersect is in the field of semiconductor metrology, where sophisticated instruments are used to determine the thickness, composition, roughness, density, porosity, and crystal structure of thin films deposited on the surface of semiconductor wafers as well as to locate any defects or contaminants.
In support of our semiconductor metrology tools clients, Rigaku recently opened its first Semiconductor Metrology Technology Center in Sunnyvale, CA, making these tools more accessible to the American semiconductor market. It will also facilitate closer working relationships between Rigaku and their clients, facilitating development of next-generation solutions.
During June, Rigaku is hosting a Semiconductor Forum for semiconductor professionals, experts, researchers, and enthusiasts in Neu-Isenburg, Germany, near the headquarters of Rigaku Europe SE. This two-day hybrid event will bring together scientists, engineers, and users of semiconductor metrology to develop more efficient solutions. Read more about the Forum below.
In this issue of The Bridge, we also highlight the popular CT Lab HX benchtop micro CT scanner, share our recent news about a prestigious award given to our latest mercury analysis instrument, and provide links to a number of industry-related news items.