NEX CG II Pushes the Boundaries of EDXRF — Measure Trace Element Concentrations, Even in Challenging Sample Types The Rigaku NEX CG II is a powerful, multi-element, multi-purpose benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer featuring Cartesian Geometry. It provides rapid, non-destructive qualitative and quantitative elemental analyses of sodium to uranium in almost any matrix and offers exceptional versatility for many industries. NEX CG II is well-suited for trace element analysis for environmental monitoring, industrial waste applications, recycled materials, electronic components, pharmaceutical materials, cosmetics, and many others.
What makes NEX CG II unique is its advanced three-dimensional (3D) Cartesian Geometry optical kernel, pushing the boundaries of EDXRF. Unlike conventional EDXRF spectrometers, NEX CG II is an indirect excitation system using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets in full 90° Cartesian Geometry eliminates background noise and delivers exceptionally low detection limits. This configuration, combined with a high-performance large-area SDD, offers users superior analytical capabilities for elements in highly scattering matrices like water, hydrocarbons, and biological materials.
NEX CG II excels in complex applications with trace elements and variable-base matrices, such as testing agricultural soils and plant materials, analyzing finished animal feeds, measuring waste oils, and more. Read this month’s Featured EDXRF Application Note, demonstrating the analysis of air filters using NEX CG II. |