Subject: Materials Analysis and the Environment

The Bridge | Materials Analysis eNewsletter

March 2023, ISSUE 116

WELCOME

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50th MiniFlex ANNIVERSARY

It’s been 50 years since Rigaku launched the MiniFlex in 1973, the world’s first benchtop XRD. At the time the concept was revolutionary, .... being so much smaller and cheaper than anything else on the market. Now in its 6^th generation, it has amassed over 43000 references in papers and patents and continues to be one of Rigaku’s most popular products amongst its vast portfolio satisfying the needs of academic research and teaching as well as industrial testing and quality control.

Since its introduction, the MiniFlex has consistently evolved and continually sets the standard with new innovations, despite the imitators that have come along over the years. This is a testament to the dedication of Rigaku's R&D team and their response to customer feedback and commitment to innovation.

Visit MiniFlex Anniversary page>

FEATURED ARTICLES

How X-rays are empowering better batteries

New X-ray diffraction tools are supercharging the search for superior lithium‐ion battery materials.

Peering into batteries at the push of a button

X-ray diffraction technology developed at Rigaku can deliver critical data about working lithium-ion batteries without the need for synchrotron radiation

WEBINARS

IN-DEPTH OVERVIEW OF THE USE OF X-RAY DIFFRACTION (XRD) IN THE INVESTIGATION OF ASBESTOS AND RESPIRABLE SILICA

Crystalline silica is one of the most common minerals in the earth's crust and can occur in various polymorphic phases. Although these materials appear harmless, they can become hazardous when exposed to external actions such as grinding, sawing, cutting, etc. Respirable crystalline silica (RCS) is converted into extremely small particles of a few micrometres that can cause respiratory diseases. Health and safety regulations for workers dealing with silica and asbestos are very strict. For example, respirators must be routinely analysed to determine the amount of material present.

In this context, X-ray diffraction (XRD) is one of the most important techniques for detecting and quantifying even small amounts of these hazardous substances.

Date/time

Tuesday, April 25, 2023 09:00 AM CET
Tuesday, April 25, 2023 04:00 PM CET

RIGAKU NEWS

This year (2023) in May, Rigaku Innovative Technologies Europe s.r.o. (RITE) will celebrate 15 years since it was established in 2008. The decision to acquire us, was based on the unique technology RITE was making. Even after 15 years, RITE´s high-resolution X-ray cameras have the highest spatial resolution on the market and our rotational symmetric replicated optics finds more and more customers in the field of EUV and soft X-rays. Today we like to present you our 15th year Anniversary logo. Until the official event end of May, we will present several materials about RITE. So, happy birthday RITE!

Rigaku Extends Partnership with Internationally Recognized CBRNe Program at University of Rome Tor Vergata

Rigaku Analytical Devices is pleased to announce a renewed partnership with the University of Rome Tor Vergata, in collaboration with their local representative, ABCS Srl. The program, known as CBRN Gate, provides education, training, and research activities related to global safety and security, in which Rigaku's handheld Raman analyzer product line is used for the identification of potential chemical threats. CBRN Gate is part of their International Master Course titled "Protection Against Chemical, Biological, Radiological, Nuclear and explosive (CBRNe) Events," and is property of the Health Safety Environmental Association of Rome (HESAR) Assocation. HESAR's focus is to increase environmental protection and public safety and security, as well as improving the quality of life, workplace and the ecological system.

FEATURED APPLICATION NOTES

Electroless Nickel Plating

Applied Rigaku Technologies

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Lead Analysis in Gasoline — ASTM D5059-21 — Using WDXRF ZSX Primus IVi

Rigaku Corporation

Lead

PODCAST

Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.

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